검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Influence of data analysis and other factors on the short-term stability of vertical scanning-probe microscope calibration measurements Edwards H, Jorgensen JF, Dagata J, Strausser Y, Schneir J Journal of Vacuum Science & Technology B, 16(2), 633, 1998 |
| 2 |
Increasing the Value of Atomic-Force Microscopy Process Metrology Using a High-Accuracy Scanner, Tip Characterization, and Morphological Image-Analysis Schneir J, Villarrubia JS, Mcwaid TH, Tsai VW, Dixson R Journal of Vacuum Science & Technology B, 14(2), 1540, 1996 |
| 3 |
Design of an Atomic-Force Microscope with Interferometric Position Control Schneir J, Mcwaid TH, Alexander J, Wilfley BP Journal of Vacuum Science & Technology B, 12(6), 3561, 1994 |