화학공학소재연구정보센터
검색결과 : 2건
No. Article
1 Plasma etch-back planarization coupled to chemical mechanical polishing for sub 0.18 mu m shallow trench isolation technology
Schiltz A, Palatini L, Paoli M, Rivoire M, Prola A
Journal of Vacuum Science & Technology A, 18(4), 1313, 2000
2 Germanium etching in high density plasmas for 0.18 mu m complementary metal-oxide-semiconductor gate patterning applications
Monget C, Schiltz A, Joubert O, Vallier L, Guillermet M, Tormen B
Journal of Vacuum Science & Technology B, 16(4), 1833, 1998