화학공학소재연구정보센터
검색결과 : 14건
No. Article
1 Trivalent Actinide Ions Showing Tenfold Coordination in Solution
Wessling P, Schenk T, Braun F, Beele BB, Trumm S, Trumm M, Schimmelpfennig B, Schild D, Geist A, Panak PJ
Inorganic Chemistry, 59(17), 12410, 2020
2 Orchestration Requirements for Modular Process Plants in Chemical and Pharmaceutical Industries
Klose A, Merkelbach S, Menschner A, Hensel S, Heinze S, Bittorf L, Kockmann N, Schafer C, Szmais S, Eckert M, Rude T, Scherwietes T, Santos PD, Stenger F, Holm T, Welscher W, Krink N, Schenk T, Stutz A, Maurmaier M, Stark K, Hoernicke M, Unland S, Erben S, Kessler F, Apitz F, Urbas L
Chemical Engineering & Technology, 42(11), 2282, 2019
3 Lanthanum-Doped Hafnium Oxide: A Robust Ferroelectric Material
Schroeder U, Richter C, Park MH, Schenk T, Pesic M, Hoffmann M, Fengler FPG, Pohl D, Rellinghaus B, Zhou CZ, Chung CC, Jones JL, Mikolajick T
Inorganic Chemistry, 57(5), 2752, 2018
4 In situ study of the tensile deformation micro-mechanisms of semi-crystalline poly(ethylene terephthalate) films using synchrotron radiation X-ray scattering
Donnay M, Poncot M, Tinnes JP, Schenk T, Ferry O, Royaud I
Polymer, 117, 268, 2017
5 Physical Mechanisms behind the Field-Cycling Behavior of HfO2-Based Ferroelectric Capacitors
Pesic M, Fengler FPG, Larcher L, Padovani A, Schenk T, Grimley ED, Sang XH, LeBeau JM, Slesazeck S, Schroeder U, Mikolajick T
Advanced Functional Materials, 26(25), 4601, 2016
6 Complementarities of high energy WAXS and Raman spectroscopy measurements to study the crystalline phase orientation in polypropylene blends during tensile test
Poncot M, Martin J, Chaudemanche S, Ferry O, Schenk T, Tinnes JP, Chapron D, Royaud I, Dahoun A, Bourson P
Polymer, 80, 27, 2015
7 Ferroelectricity in Si-Doped HfO2 Revealed: A Binary Lead-Free Ferroelectric
Martin D, Muller J, Schenk T, Arruda TM, Kumar A, Strelcov E, Yurchuk E, Muller S, Pohl D, Schroder U, Kalinin SV, Mikolajick T
Advanced Materials, 26(48), 8198, 2014
8 In situ analysis of the influence of convection during the initial transient of planar solidification
Bogno A, Reinhart G, Buffet A, Thi HN, Billia B, Schenk T, Mangelinck-Noel N, Bergeon N, Baruchel J
Journal of Crystal Growth, 318(1), 1134, 2011
9 Quantitative analysis of in situ wafer bowing measurements for III-nitride growth on sapphire
Brunner F, Knauer A, Schenk T, Weyers M, Zettler JT
Journal of Crystal Growth, 310(10), 2432, 2008
10 In situ and real-time analysis of TGZM phenomena by synchrotron X-ray radiography
Thi HN, Reinhart G, Buffet A, Schenk T, Mangelinck-Noel N, Jung H, Bergeon N, Billia B, Hartwig J, Baruchel J
Journal of Crystal Growth, 310(11), 2906, 2008