검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Structural investigation on the nature of surface defects present in silicon carbide wafers containing varying amount of micropipes Shamsuzzoha M, Saddow SE, Schattner TE, Jin L, Dudley M, Rendakova SV, Dmitriev VA Materials Science Forum, 338-3, 453, 2000 |
| 2 |
4H-SiC device scaling development on repaired micropipe substrates Schattner TE, Casady JB, Smith MCD, Mazzola MS, Dimitriev VA, Rentakova SV, Saddow SE Materials Science Forum, 338-3, 1203, 2000 |