검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Imaging charge carriers in potential-induced degradation defects of c-Si solar cells by scanning capacitance microscopy Jiang CS, Xiao C, Moutinho HR, Johnston S, Al-Jassim MM, Yang X, Chen Y, Ye J Solar Energy, 162, 330, 2018 |
| 2 |
Techniques for depth profiling of dopants in 4H-SiC Osterman J, Hallen A, Anand S, Linnarsson MK, Andersson H, Aberg D, Panknin D, Skorupa W Materials Science Forum, 353-356, 559, 2001 |