검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Nanoscale effects in carbon structures fabricated using focused ion beam-chemical vapor deposition Kim CS, Ahn SH, Jang DY Thin Solid Films, 518(18), 5177, 2010 |
| 2 |
A comparison of vertical scanning interferometry (VSI) and atomic force microscopy (AFM) for characterizing membrane surface topography Koyuncu I, Brant J, Luttge A, Wiesner MR Journal of Membrane Science, 278(1-2), 410, 2006 |