화학공학소재연구정보센터
검색결과 : 18건
No. Article
1 Characterization of monolayer formation on aluminum-doped zinc oxide thin films
Rhodes CL, Lappi S, Fischer D, Sambasivan S, Genzer J, Franzen S
Langmuir, 24(2), 433, 2008
2 Understanding deviations in lithographic patterns near interfaces: Characterization of bottom anti-reflective coatings (BARC) and the BARC-resist interface
Lenhart JL, Fischer D, Sambasivan S, Lin EK, Wu WL, Guerrero DJ, Wang YB, Puligadda R
Applied Surface Science, 253(9), 4166, 2007
3 Effect of cross-linking ultrahigh molecular weight polyethylene: Surface molecular orientation and wear characteristics
Sambasivan S, Fischer DA, Hsu SM
Journal of Vacuum Science & Technology A, 25(4), 932, 2007
4 Measuring molecular order in poly(3-alkylthiophene) thin films with polarizing spectroscopies
Gurau MC, Delongchamp DM, Vogel BM, Lin EK, Fischer DA, Sambasivan S, Richter LJ
Langmuir, 23(2), 834, 2007
5 Quantitative depth profiling of photoacid generators in photoresist materials by near-edge X-ray absorption fine structure spectroscopy
Prabhu VM, Sambasivan S, Fischer D, Sundberg LK, Allen RD
Applied Surface Science, 253(2), 1010, 2006
6 Effect of self-assembled monolayer film order on nanofriction
Sambasivan S, Hsieh S, Fischer DA, Hsu SM
Journal of Vacuum Science & Technology A, 24(4), 1484, 2006
7 Direct correlation of organic semiconductor film structure to field-effect mobility
DeLongchamp DM, Sambasivan S, Fischer DA, Lin EK, Chang P, Murphy AR, Frechet JMJ, Subramanian V
Advanced Materials, 17(19), 2340, 2005
8 Near-edge X-ray absorption fine structure investigations of order in carbon nanotube-based systems
Banerjee S, Hemraj-Benny T, Sambasivan S, Fischer DA, Misewich JA, Wong SS
Journal of Physical Chemistry B, 109(17), 8489, 2005
9 X-ray absorption spectroscopy to probe surface composition and surface deprotection in photoresist films
Lenhart JL, Fischer DA, Sambasivan S, Lin EK, Jones RL, Soles CL, Wu WL, Goldfarb DL, Angelopoulos M
Langmuir, 21(9), 4007, 2005
10 Mapping surface chemistry and molecular orientation with combinatorial near-edge X-ray absorption fine structure spectroscopy
Fischer DA, Efimenko K, Bhat RR, Sambasivan S, Genzer J
Macromolecular Rapid Communications, 25(1), 141, 2004