화학공학소재연구정보센터
검색결과 : 4건
No. Article
1 Nondestructive extraction of junction depths of active doping profiles from photomodulated optical reflectance offset curves
Bogdanowicz J, Dortu F, Clarysse T, Vandervorst W, Rosseel E, Nguyen ND, Shaughnessy D, Salnik A, Nicolaides L
Journal of Vacuum Science & Technology B, 28(1), C1C1, 2010
2 Study of submelt laser induced junction nonuniformities using Therma-Probe
Rosseel E, Bogdanowicz J, Clarysse T, Vandervorst W, Ortolland C, Hoffmann T, Salnik A, Nicolaides L, Han SH, Petersen DH, Lin R, Hansen O
Journal of Vacuum Science & Technology B, 28(1), C1C21, 2010
3 Advances in optical carrier profiling through high-frequency modulated optical reflectance
Bogdanowicz J, Dortu F, Clarysse T, Vandervorst W, Shaughnessy D, Salnik A, Nicolaides L, Opsal J
Journal of Vacuum Science & Technology B, 26(1), 310, 2008
4 Towards nondestructive carrier depth profiling
Clarysse T, Vandervorst W, Bakshi M, Nicolaides L, Salnik A, Opsal J
Journal of Vacuum Science & Technology B, 24(3), 1139, 2006