화학공학소재연구정보센터
검색결과 : 11건
No. Article
1 A rice gene that confers broad-spectrum resistance to beta-triketone herbicides
Maeda H, Murata K, Sakuma N, Takei S, Yamazaki A, Karim MR, Kawata M, Hirose S, Kawagishi-Kobayashi M, Taniguchi Y, Suzuki S, Sekino K, Ohshima M, Kato H, Yoshida H, Tozawa Y
Science, 365(6451), 393, 2019
2 Stable Radical Anions Inside Fullerene Cages: Formation of Reversible Electron Transfer Systems
Tsuchiya T, Wielopolski M, Sakuma N, Mizorogi N, Akasaka T, Kato T, Guldi DM, Nagase S
Journal of the American Chemical Society, 133(34), 13280, 2011
3 Dynamic behavior of cyclic hemiacetals of 2-hydroxy-2-(2-hydroxyphenyl)-1,3-indandione derivatives
Hashimoto S, Sakuma N, Wakabayashi H, Miyamae H, Kobayashi K
Chemistry Letters, 37(7), 696, 2008
4 Conversion of anisotropically phase-segregated Pd/gamma-Fe2O3 nanoparticles into exchange-coupled fct-FePd/alpha-Fe nanocomposite magnets
Teranishi T, Wachi A, Kanehara M, Shoji T, Sakuma N, Nakaya M
Journal of the American Chemical Society, 130(13), 4210, 2008
5 Effects of mechanical parameters on CMP characteristics analyzed by two-dimensional frictional-force measurement
Homma Y, Fukushima K, Kondo S, Sakuma N
Journal of the Electrochemical Society, 150(12), G751, 2003
6 Cholesteryl ester transfer protein deficiency causes slow egg embryonation of Schistosoma japonicum
Okumura-Noji K, Sasai K, Zhan RL, Kawaguchi H, Maruyama H, Tada T, Takahashi H, Okazaki M, Miida T, Sakuma N, Kimura G, Ohta N, Yokoyama S
Biochemical and Biophysical Research Communications, 286(2), 305, 2001
7 Direct resist removal process from copper-exposed vias for low-parasitic-capacitance interconnects
Furusawa T, Sakuma N, Ryuzaki D, Kondo S, Takeda K, Machida S, Yoneyama R, Hinode K
Journal of the Electrochemical Society, 148(4), G190, 2001
8 Control of photocorrosion in the copper damascene process
Homma Y, Kondo S, Sakuma N, Hinode K, Noguchi J, Ohashi N, Yamaguchi H, Owada N
Journal of the Electrochemical Society, 147(3), 1193, 2000
9 Abrasive-free polishing for copper damascene interconnection
Kondo S, Sakuma N, Homma Y, Goto Y, Ohashi N, Yamaguchi H, Owada N
Journal of the Electrochemical Society, 147(10), 3907, 2000
10 Self-aligned Si gate field emitter arrays using the transfer mold technique
Sakai T, Ono T, Nakamoto M, Sakuma N
Journal of Vacuum Science & Technology B, 16(2), 770, 1998