검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Internal gettering for Ni contamination in Czochralski silicon wafers Sueoka K, Sadamitsu S, Koike Y, Kihara T, Katahama H Journal of the Electrochemical Society, 147(8), 3074, 2000 |
| 2 |
Observation of Ring-Osf Nuclei in Cz-Si Using Short-Time Annealing and Infrared Light-Scattering Tomography Marsden K, Sadamitsu S, Hourai M, Sumita S, Shigematsu T Journal of the Electrochemical Society, 142(3), 996, 1995 |