검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Point defect dynamics and the oxidation-induced stacking-fault ring in Czochralski-grown silicon crystals Sinno T, Brown RA, von Ammon W, Dornberger E Journal of the Electrochemical Society, 145(1), 302, 1998 |
| 2 |
Plane-Wave X-Ray Topography Using Imaging Plates and Its Application to Characterization of Lattice Distortion in as-Grown Silicon Kudo Y, Liu KY, Kojima S, Kawado S, Ishikawa T Journal of the Electrochemical Society, 144(11), 4035, 1997 |