검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Simulation study of a novel 3D SPAD pixel in an advanced FD-SOI technology Vignetti MM, Calmon F, Lesieur P, Savoy-Navarro A Solid-State Electronics, 128, 163, 2017 |
| 2 |
Comprehensive understanding of dark count mechanisms of single-photon avalanche diodes fabricated in deep sub-micron CMOS technologies Xu YX, Xiang P, Xie XP Solid-State Electronics, 129, 168, 2017 |
| 3 |
A low-noise single-photon detector implemented in a 130 nm CMOS imaging process Gersbach M, Richardson J, Mazaleyrat E, Hardillier S, Niclass C, Henderson R, Grant L, Charbon E Solid-State Electronics, 53(7), 803, 2009 |
| 4 |
Accident versus near miss causation: a critical review of the literature, an empirical test in the UK railway domain, and their implications for other sectors Wright L, van der Schaaf T Journal of Hazardous Materials, 111(1-3), 105, 2004 |