| 1 |
An O-2(+) probe energy study for boron quantification in Si1-xGex (0 <= x <= 1) using secondary ion mass spectrometry
Morris RJH
Applied Surface Science, 390, 778, 2016 |
| 2 |
Quantitative static Time-of-Flight Secondary Ion Mass Spectrometry analysis of anionic minority species in microelectronic substrates
Ravanel X, Trouiller C, Juhel M, Wyon C, Kwakman LFT, Leonard D
Applied Surface Science, 255(4), 1415, 2008 |
| 3 |
Storing Matter: A new quantitative and sensitive analytical technique
Wirtz T, Migeon HN
Applied Surface Science, 255(4), 1498, 2008 |
| 4 |
The Storing Matter technique: Application to inorganic samples
Philipp P, Lacour F, Wirtz T, Houssiau L, Pireaux JJ, Migeon HN
Applied Surface Science, 255(4), 1501, 2008 |
| 5 |
Quantitative depth profiling of an alternating Pt/Co multilayer and a Pt-Co alloy multilayer by SIMS using a Buckminsterfullerene (C-60) source
Kim KJ, Simons D, Gillen G
Applied Surface Science, 253(14), 6000, 2007 |
| 6 |
ToF-SIMS quantitative approaches in copolymers and polymer blends
Weng LT, Chan CM
Applied Surface Science, 203, 532, 2003 |
| 7 |
Detection and quantification of benzodiazepines in hair by ToF-SIMS: preliminary results
Audinot JN, Yegles M, Labarthe A, Ruch D, Wennig R, Migeon HN
Applied Surface Science, 203, 718, 2003 |
| 8 |
SIMS depth profile analysis of wear resistant coatings on cutting tools and technical components
Willich P, Steinberg C
Applied Surface Science, 179(1-4), 263, 2001 |
