화학공학소재연구정보센터
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No. Article
1 Extra-low parasitic gate-to-contacts capacitance architecture for sub-14 nm transistor nodes
Niebojewski H, Le Royer C, Morand Y, Rozeau O, Jaud MA, Dubois E, Poiroux T, Bensahel D
Solid-State Electronics, 97, 45, 2014
2 A unified short-channel compact model for cylindrical surrounding-gate MOSFET
Cousin B, Reyboz M, Rozeau O, Jaud MA, Ernst T, Jomaah J
Solid-State Electronics, 56(1), 40, 2011
3 High frequency performance of sub-100 nm UTB-FDSOI featuring TiN/HfO2 gate stack
Lim TC, Rozeau O, Buj C, Paccaud M, Lepilliet S, Dambrine G, Danneville F
Solid-State Electronics, 53(4), 433, 2009
4 Continuous model for independent double gate MOSFET
Reyboz M, Martin P, Poiroux T, Rozeau O
Solid-State Electronics, 53(5), 504, 2009
5 Polysilicon high frequency devices for large area electronics: Characterization, simulation and modeling
Botrel JL, Savry O, Rozeau O, Templier F, Jomaah J
Thin Solid Films, 515(19), 7422, 2007
6 Performance and physics of sub-50 nm strained Si on Si1-xGex-on-insulator (SGOI) nMOSFETs
Andrieu F, Ernst T, Faynot O, Rozeau O, Bogumilowicz Y, Hartmann JM, Brevard L, Toffoli A, Lafond D, Ghyselen B, Fournel F, Ghibaudo G, Deleonibus S
Solid-State Electronics, 50(4), 566, 2006
7 An explicit analytical charge-based model of undoped independent double gate MOSFET
Reyboz M, Rozeau O, Poiroux T, Martin P, Jomaah J
Solid-State Electronics, 50(7-8), 1276, 2006
8 Characterization of silicon-on-sapphire material and devices for radio frequency applications
Munteanu D, Cristoloveanu S, Rozeau O, Jomaah J, Boussey J, Wetzel M, de la Houssaye P, Lagnado I
Journal of the Electrochemical Society, 148(4), G218, 2001