검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
The defect-centric perspective of device and circuit reliability-From gate oxide defects to circuits Kaczer B, Franco J, Weckx P, Roussel PJ, Simicic M, Putcha V, Bury E, Cho M, Degraeve R, Linten D, Groeseneken G, Debacker P, Parvais B, Raghavan P, Catthoor F, Rzepa G, Waltl M, Goes W, Grasser T Solid-State Electronics, 125, 52, 2016 |
| 2 |
Investigation of Bias-Temperature Instability in work-function-tuned high-k/metal-gate stacks Kaczer B, Veloso A, Roussel PJ, Grasser T, Groeseneken G Journal of Vacuum Science & Technology B, 27(1), 459, 2009 |
| 3 |
Impact of nitridation on recoverable and permanent negative bias temperature instability degradation in high-k/metal-gate p-type metal oxide semiconductor field effect transistors Aoulaiche M, Kaczer B, Roussel PJ, O'Connor R, Houssa M, De Gendt S, Maes HE, Groeseneken G Journal of Vacuum Science & Technology B, 27(1), 463, 2009 |