| 1 |
Dual rotating compensator ellipsometry: Theory and simulations
Li JA, Ramanujam B, Collins RW
Thin Solid Films, 519(9), 2725, 2011 |
| 2 |
Rotating compensator sampling for spectroscopic imaging ellipsometry
Meng YH, Jin G
Thin Solid Films, 519(9), 2742, 2011 |
| 3 |
The ultimate in real-time ellipsometry: Multichannel Mueller matrix spectroscopy
Chen C, Horn MW, Pursel S, Ross C, Collins RW
Applied Surface Science, 253(1), 38, 2006 |
| 4 |
Multichannel Mueller matrix ellipsometer based on the dual rotating compensator principle
Chen C, An I, Ferreira GM, Podraza NJ, Zapien JA, Collins RW
Thin Solid Films, 455-56, 14, 2004 |
| 5 |
Comparison of the capabilities of rotating-analyzer and rotating-compensator ellipsometers by measurements on a single system
Mori T, Aspnes DE
Thin Solid Films, 455-56, 33, 2004 |
| 6 |
Calibration and data reduction for a UV-extended rotating-compensator multichannel ellipsometer
An I, Zapien JA, Chen C, Ferlauto AS, Lawrence AS, Collins RW
Thin Solid Films, 455-56, 132, 2004 |
| 7 |
Simultaneous determination of bulk isotropic and surface-induced anisotropic complex dielectric functions of semiconductors from high speed Mueller matrix ellipsometry
Chen C, An I, Collins RW
Thin Solid Films, 455-56, 196, 2004 |
| 8 |
Integrated rotating-compensator polarimeter for real-time measurements and analysis of organometallic chemical vapor deposition
Flock K, Kim SJ, Asar M, Kim IK, Aspnes DE
Thin Solid Films, 455-56, 639, 2004 |
| 9 |
Biplate artifacts in rotating-compensator ellipsometers
Ebert K, Aspnes DE
Thin Solid Films, 455-56, 779, 2004 |
