검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Low energy secondary ion mass spectrometry with sub-keV O-2(+) beams at glancing incidence Jiang ZX, Kim K, Guenther T, Robichaud B, Benavides J, Contreras L, Sieloff DD Journal of Vacuum Science & Technology A, 26(5), 1120, 2008 |