검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
A multiphysics model that can capture crack patterns in Si thin films based on their microstructure Rethore J, Zheng H, Li H, Li JJ, Aifantis KE Journal of Power Sources, 400, 383, 2018 |
| No. | Article |
|---|---|
| 1 |
A multiphysics model that can capture crack patterns in Si thin films based on their microstructure Rethore J, Zheng H, Li H, Li JJ, Aifantis KE Journal of Power Sources, 400, 383, 2018 |