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| No. | Article |
|---|---|
| 1 |
Structural investigation on the nature of surface defects present in silicon carbide wafers containing varying amount of micropipes Shamsuzzoha M, Saddow SE, Schattner TE, Jin L, Dudley M, Rendakova SV, Dmitriev VA Materials Science Forum, 338-3, 453, 2000 |