검색결과 : 22건
| No. | Article |
|---|---|
| 1 |
Preface Bailly A, Djurado E, Felici R, Galtayries A, Renault O Applied Surface Science, 432, 1, 2018 |
| 2 |
Forming mechanism of Te-based conductive-bridge memories Mendes MK, Martinez E, Marty A, Veillerot M, Yamashita Y, Gassilloud R, Bernard M, Renault O, Barrett N Applied Surface Science, 432, 34, 2018 |
| 3 |
Determination of the input parameters for inelastic background analysis combined with HAXPES using a reference sample Zborowski C, Renault O, Torres A, Yamashita Y, Grenet G, Tougaard S Applied Surface Science, 432, 60, 2018 |
| 4 |
Effective inelastic scattering cross-sections for background analysis in HAXPES of deeply buried layers Risterucci P, Renault O, Zborowski C, Bertrand D, Torres A, Rueff JP, Ceolin D, Grenet G, Tougaard S Applied Surface Science, 402, 78, 2017 |
| 5 |
Chemistry of surface nanostructures in lead precursor-rich PbZr0.52Ti0.48O3 sol-gel films Gueye I, Le Rhun G, Gergaud P, Renault O, Defay E, Barrett N Applied Surface Science, 363, 21, 2016 |
| 6 |
Covalent Design for Dye-Sensitized H-2-Evolving Photocathodes Based on a Cobalt Diimine-Dioxime Catalyst Kaeffer N, Massin J, Lebrun C, Renault O, Chavarot-Kerlidou M, Artero V Journal of the American Chemical Society, 138(38), 12308, 2016 |
| 7 |
Study of the La-related dipole in TiN/LaOx/HfSiON/SiON/Si gate stacks using hard X-ray photoelectron spectroscopy and backside medium energy ion scattering Boujamaa R, Martinez E, Pierre F, Renault O, Detlefs B, Zegenhagen J, Baudot S, Gros-Jean M, Bertin F, Dubourdieu C Applied Surface Science, 335, 71, 2015 |
| 8 |
Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Inter laboratory Study (vol 119, pg 10784, 2015) Shard AG, Havelund R, Spencer SJ, Gilmore IS, Alexander MR, Angerer TB, Aoyagi S, Barnes JP, Benayad A, Bernasik A, Ceccone G, Counsell JDP, Deeks C, Fletcher JS, Graham DJ, Heuser C, Lee TG, Marie C, Marzec MM, Mishra G, Rading D, Renault O, Scurr DJ, Shon HK, Spampinato V, Tian H, Wang FY, Winograd N, Wu K, Wucher A, Zhou YF, Zhu ZH, Cristaudo V, Poleunis C Journal of Physical Chemistry B, 119(44), 14337, 2015 |
| 9 |
Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study Shard AG, Havelund R, Spencer SJ, Gilmore IS, Alexander MR, Angerer TB, Aoyagi S, Barnes JP, Benayad A, Bernasik A, Ceccone G, Counsell JDP, Deeks C, Fletcher JS, Graham DJ, Heuser C, Lee TG, Marie C, Marzec MM, Mishra G, Rading D, Renault O, Scurr DJ, Shon HK, Spampinato V, Tian H, Wang FY, Winograd N, Wu K, Wucher A, Zhou YF, Zhu ZH Journal of Physical Chemistry B, 119(33), 10784, 2015 |
| 10 |
Soft X-ray photoemission study of nitrogen diffusion in TiN/HfO:N gate stacks Martinez E, Gaumer C, Lhostis S, Licitra C, Silly M, Sirotti F, Renault O Applied Surface Science, 258(6), 2107, 2012 |