검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Non volatile memory reliability evaluation based on oxide defect generation rate during stress and retention test Aziza H, Portal JM, Plantier J, Reliaud C, Regnier A, Ogier JL Solid-State Electronics, 78, 151, 2012 |
| No. | Article |
|---|---|
| 1 |
Non volatile memory reliability evaluation based on oxide defect generation rate during stress and retention test Aziza H, Portal JM, Plantier J, Reliaud C, Regnier A, Ogier JL Solid-State Electronics, 78, 151, 2012 |