검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Deuterium depth profile quantification in a ASDEX Upgrade divertor tile using secondary ion mass spectrometry Ghezzi F, Caniello R, Giubertoni D, Bersani M, Hakola A, Mayer M, Rohde V, Anderle M Applied Surface Science, 315, 459, 2014 |
| 2 |
Dependence of the relative sensitivity factor of nitrogen on various oxynitride dielectric matrixes Zhu L, Teo HW, Huang YH, Ong K, Hua YN Thin Solid Films, 542, 134, 2013 |
| 3 |
Long-term reproducibility of relative sensitivity factors obtained with CAMECA Wf Gui D, Xing ZX, Huang YH, Mo ZQ, Hua YN, Zhao SP, Cha LZ Applied Surface Science, 255(4), 1427, 2008 |
| 4 |
Experimentally derived Auger transition probabilities in X-ray excited Auger electron spectroscopy (XAES) Tanaka A, Nakamura T, Hirokawa K Applied Surface Science, 169, 160, 2001 |