검색결과 : 5건
No. | Article |
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1 |
Nanostructured chromium nitride films with a valley of residual stress Zhao ZB, Rek ZU, Yalisove SM, Bilello JC Thin Solid Films, 472(1-2), 96, 2005 |
2 |
In situ x-ray diffraction observation of multiple texture turnovers in sputtered Cr films Zhao ZB, Rek ZU, Yalisove SM, Bilello JC Journal of Vacuum Science & Technology A, 22(6), 2365, 2004 |
3 |
Strain Gradients and Normal Stresses in Textured Mo Thin-Films Malhotra SG, Rek ZU, Yalisove SM, Bilello JC Journal of Vacuum Science & Technology A, 15(2), 345, 1997 |
4 |
Analysis of Thin-Film Stress Measurement Techniques Malhotra SG, Rek ZU, Yalisove SM, Bilello JC Thin Solid Films, 301(1-2), 45, 1997 |
5 |
Microstructure and Residual-Stress of Very Thin Mo Films Adams DP, Parfitt LJ, Bilello JC, Yalisove SM, Rek ZU Thin Solid Films, 266(1), 52, 1995 |