화학공학소재연구정보센터
검색결과 : 6건
No. Article
1 Monitoring of (reactive) ion etching (RIE) with reflectance anisotropy spectroscopy (RAS) equipment
Barzen L, Richter J, Fouckhardt H, Wahl M, Kopnarsk M
Applied Surface Science, 328, 120, 2015
2 Influence of plasma composition on reflectance anisotropy spectra for in situ III-V semiconductor dry-etch monitoring
Barzen L, Kleinschmidt AK, Strassner J, Doering C, Fouckhardt H, Bock W, Wahl M, Kopnarski M
Applied Surface Science, 357, 530, 2015
3 MOVPE growth of InGaAs/GaAsP-MQWs for high-power laser diodes studied by reflectance anisotropy spectroscopy
Bugge F, Zorn M, Zeimer U, Pietrzak A, Erbert G, Weyers M
Journal of Crystal Growth, 311(4), 1065, 2009
4 Application of reflectance anisotropy spectroscopy to laser-diode growth in MOVPE
Zorn M, Weyers M
Journal of Crystal Growth, 276(1-2), 29, 2005
5 Optical anisotropy and surface morphology of InGaAs lattice-mismatched with GaAS(001)
Morimura T, Mori T, Cho MW, Hanada T, Yao T
Current Applied Physics, 4(6), 621, 2004
6 Optical anisotropy of GaNAs grown on GaAS(001) substrate
Mori T, Hanada T, Morimura T, Cho MW, Yao T
Current Applied Physics, 4(6), 640, 2004