화학공학소재연구정보센터
검색결과 : 11건
No. Article
1 Vacancy formation in GaAs under different equilibrium conditions
Bondarenko V, Gebauer J, Redmann F, Krause-Rehberg R
Materials Science Forum, 445-6, 54, 2004
2 Improved defect profiling with slow positrons
Krause-Rehberg R, Borner F, Redmann F, Egger W, Kogel G, Sperr P, Triftshauser W
Applied Surface Science, 194(1-4), 210, 2002
3 Humidity-induced plasticization and antiplasticization of polyamide 6: A positron lifetime study of the local free volume
Dlubek G, Redmann F, Krause-Rehberg R
Journal of Applied Polymer Science, 84(2), 244, 2002
4 Interdiffusion in a particle matrix system of two miscible polymers: An investigation by positron annihilation lifetime spectroscopy and differential scanning calorimetry
Dlubek G, Taesler C, Pompe G, Pionteck J, Petters K, Redmann F, Krause-Rehberg R
Journal of Applied Polymer Science, 84(3), 654, 2002
5 Radiation-induced defects in 4H-and 6H-SiC epilayers studied by positron annihilation and deep-level transient spectroscopy
Kawasuso A, Weidner M, Redmann F, Frank T, Krause-Rehberg R, Pensl G, Sperr P, Triftshauser W, Itoh H
Materials Science Forum, 389-3, 489, 2002
6 Polytype-dependent vacancy annealing studied by positron annihilation
Kawasuso A, Yoshikawa M, Maekawa M, Itoh H, Chiba T, Redmann F, Krause-Rehberg R, Weidner M, Frank T, Pensl G
Materials Science Forum, 433-4, 477, 2002
7 Annealing process of defects in epitaxial SiC induced by He and electron irradiation: Positron annihilation study
Kawasuso A, Redmann F, Krause-Rehberg R, Sperr P, Frank T, Weidner M, Pensl G, Itoh H
Materials Science Forum, 353-356, 537, 2001
8 Detailed microscopic defect identification in GaAs
Gebauer J, Staab TEM, Redmann F, Krause-Rehberg R
Materials Science Forum, 363-3, 76, 2001
9 Formation of vacancy clusters during copper diffusion in semi-insulating GaAs
Petters K, Gebauer J, Redmann F, Leipner HS, Krause-Rehberg R
Materials Science Forum, 363-3, 111, 2001
10 Effects of illumination on positron lifetime of electron irradiated n-type 6H-SiC
Redmann F, Kawasuso A, Petters K, Krause-Rehberg R, Itoh H
Materials Science Forum, 363-3, 126, 2001