검색결과 : 2건
No. | Article |
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1 |
Al2O3-SiO2 stack with enhanced reliability Lisiansky M, Fenigstein A, Heiman A, Raskin Y, Roizin Y, Bartholomew L, Owyang J, Gladkikh A, Brener R, Geppert I, Lyakin E, Meyler B, Shnieder Y, Yofis S, Eizenberg M Journal of Vacuum Science & Technology B, 27(1), 476, 2009 |
2 |
Protection of silicon wafers from alkali contamination during high-temperature processing using electric field Beregovsky M, Klyuch A, Raskin Y, Zinman Y, Shacham-Diamand Y, Deal BE Journal of the Electrochemical Society, 147(10), 3892, 2000 |