검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Highly uniform and reliable resistive switching characteristics of a Ni/WOx/p(+)-Si memory device Kim TH, Kim S, Kim H, Kim MH, Bang S, Cho S, Park BG Solid-State Electronics, 140, 51, 2018 |
| 2 |
Dopant diffusion during rapid thermal oxidation Stadler A, Sulima T, Schulze J, Fink C, Kottantharayil A, Hansch W, Baumgartner H, Eisele I, Lerch W Solid-State Electronics, 44(5), 831, 2000 |