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| No. | Article |
|---|---|
| 1 |
A Method for Monitoring the Thickness of Semiconductor and Dielectric Thin-Films - Application to the Determination of Large-Area Thickness Profiles Laaziz Y, Bennouna A, Elazhari MY, Ramirobargueno J, Outzourhit A, Chahboun N, Ameziane EL Thin Solid Films, 303(1-2), 255, 1997 |