검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Surface-Energy Characterization of Full-Wafer Bonds Using the Concealed Blister Test Method Rabold M, Busch D, Goldschmidtboeing F, Woias P Electrochemical and Solid State Letters, 12(5), H176, 2009 |
| 2 |
The modified blister test method Rabold M, Doll A, Goldschmidtboeing F, Woias P Journal of the Electrochemical Society, 154(7), H647, 2007 |