검색결과 : 3건
No. | Article |
---|---|
1 |
Characterization of silicon oxynitride thin films by x-ray photoelectron spectroscopy Shallenberger JR, Cole DA, Novak SW Journal of Vacuum Science & Technology A, 17(4), 1086, 1999 |
2 |
Titanium Nitridation on Copper Surfaces Russell SW, Rack MJ, Adams D, Alford TL, Levine TE, Nastasi M Journal of the Electrochemical Society, 143(7), 2349, 1996 |
3 |
High-Temperature Local Oxidation of Silicon Field Isolation Morphological Characterization Deleonibus S Journal of the Electrochemical Society, 143(11), L259, 1996 |