검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
On the temperature dependence of Na migration in thin SiO2 films during ToF-SIMS O-2(+) depth profiling Krivec S, Detzel T, Buchmayr M, Hutter H Applied Surface Science, 257(1), 25, 2010 |
| 2 |
Determination of the Lateral Spread of Xe Ions in Silicon-Nitride and Hydrated Silicon-Nitride Films by Oblique-Incidence Rutherford Backscattering Wang KM, Qu BD, Shi BR, Lu F, Meng MQ, Wang ZL, Wang W, Ding PJ Journal of Vacuum Science & Technology A, 14(1), 240, 1996 |