검색결과 : 11건
No. | Article |
---|---|
1 |
Effect of calcium ions on the adsorption of CMC onto the basal planes of New York talc - A ToF-SIMS study Burdukova E, Van Leerdam GC, Prins FE, Smeink RG, Bradshaw DJ, Laskowski JS Minerals Engineering, 21(12-14), 1020, 2008 |
2 |
The use of ToF-SIMS and microflotation to assess the reversibility of binding of CMC onto talc Parolis LAS, van der Merwe R, van Leerdam GC, Prins FE, Smeink RG Minerals Engineering, 20(10), 970, 2007 |
3 |
Growth of germanium quantum dots on different dielectric substrates by chemical-vapor deposition Kim DW, Kim YH, Chen XD, Lee CH, Song SC, Prins FE, Kwong DL, Banerjee S Journal of Vacuum Science & Technology B, 19(4), 1104, 2001 |
4 |
An asymmetric Si/Si1-xGex channel vertical p-type metal-oxide-semiconductor field-effect transistor Chen XD, Ouyang Q, Jayanarayanan SK, Prins FE, Banerjee S Solid-State Electronics, 45(2), 281, 2001 |
5 |
Lateral pn-junctions as a novel electron defector for microcolumn systems Fritz GS, Fresser HS, Prins FE, Kern DP Journal of Vacuum Science & Technology B, 17(6), 2836, 1999 |
6 |
Investigation of the modification mechanism induced by a scanning tunneling microscope on YBa2Cu3O7-delta Bertsche G, Clauss W, Prins FE, Kern DP Journal of Vacuum Science & Technology B, 16(5), 2833, 1998 |
7 |
Modification of YBa2Cu3O7-delta wires using a scanning tunneling microscope: Process and electrical transport effects Bertsche G, Clauss W, Prins FE, Kern DP Journal of Vacuum Science & Technology B, 16(6), 3883, 1998 |
8 |
Oxidation properties of silicon dots on silicon oxide investigated using energy filtering transmission electron microscopy Single C, Zhou F, Heidemeyer H, Prins FE, Kern DP, Plies E Journal of Vacuum Science & Technology B, 16(6), 3938, 1998 |
9 |
Resist processes for low-energy electron-beam lithography Schock KD, Prins FE, Strahle S, Kern DP Journal of Vacuum Science & Technology B, 15(6), 2323, 1997 |
10 |
Characterization and Application of a Low-Profile Metal-Semiconductor-Metal Detector for Low-Energy Backscattered Electrons Meier GD, Fresser HS, Prins FE, Kern DP Journal of Vacuum Science & Technology B, 14(6), 3821, 1996 |