화학공학소재연구정보센터
검색결과 : 11건
No. Article
1 Effect of calcium ions on the adsorption of CMC onto the basal planes of New York talc - A ToF-SIMS study
Burdukova E, Van Leerdam GC, Prins FE, Smeink RG, Bradshaw DJ, Laskowski JS
Minerals Engineering, 21(12-14), 1020, 2008
2 The use of ToF-SIMS and microflotation to assess the reversibility of binding of CMC onto talc
Parolis LAS, van der Merwe R, van Leerdam GC, Prins FE, Smeink RG
Minerals Engineering, 20(10), 970, 2007
3 Growth of germanium quantum dots on different dielectric substrates by chemical-vapor deposition
Kim DW, Kim YH, Chen XD, Lee CH, Song SC, Prins FE, Kwong DL, Banerjee S
Journal of Vacuum Science & Technology B, 19(4), 1104, 2001
4 An asymmetric Si/Si1-xGex channel vertical p-type metal-oxide-semiconductor field-effect transistor
Chen XD, Ouyang Q, Jayanarayanan SK, Prins FE, Banerjee S
Solid-State Electronics, 45(2), 281, 2001
5 Lateral pn-junctions as a novel electron defector for microcolumn systems
Fritz GS, Fresser HS, Prins FE, Kern DP
Journal of Vacuum Science & Technology B, 17(6), 2836, 1999
6 Investigation of the modification mechanism induced by a scanning tunneling microscope on YBa2Cu3O7-delta
Bertsche G, Clauss W, Prins FE, Kern DP
Journal of Vacuum Science & Technology B, 16(5), 2833, 1998
7 Modification of YBa2Cu3O7-delta wires using a scanning tunneling microscope: Process and electrical transport effects
Bertsche G, Clauss W, Prins FE, Kern DP
Journal of Vacuum Science & Technology B, 16(6), 3883, 1998
8 Oxidation properties of silicon dots on silicon oxide investigated using energy filtering transmission electron microscopy
Single C, Zhou F, Heidemeyer H, Prins FE, Kern DP, Plies E
Journal of Vacuum Science & Technology B, 16(6), 3938, 1998
9 Resist processes for low-energy electron-beam lithography
Schock KD, Prins FE, Strahle S, Kern DP
Journal of Vacuum Science & Technology B, 15(6), 2323, 1997
10 Characterization and Application of a Low-Profile Metal-Semiconductor-Metal Detector for Low-Energy Backscattered Electrons
Meier GD, Fresser HS, Prins FE, Kern DP
Journal of Vacuum Science & Technology B, 14(6), 3821, 1996