검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Strain and Bond Length Dynamics upon Growth and Transfer of Graphene by NEXAFS Spectroscopy from First-Principles and Experiment Rojas WY, Winter AD, Grote J, Kim SS, Naik RR, Williams AD, Weiland C, Principe E, Fischer DA, Banerjee S, Prendergast D, Campo EM Langmuir, 34(4), 1783, 2018 |
| 2 |
SiO2 thickness determination by x-ray photoelectron spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, Rutherford backscattering, transmission electron microscopy, and ellipsometry Cole DA, Shallenberger JR, Novak SW, Moore RL, Edgell MJ, Smith SP, Hitzman CJ, Kirchhoff JF, Principe E, Nieveen W, Huang FK, Biswas S, Bleiler RJ, Jones K Journal of Vacuum Science & Technology B, 18(1), 440, 2000 |