검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Ellipsometric characterization of multi-component thin films: Determination of elemental content from optical dispersion Varghese R, Pribil G, Reynolds WT, Priya S Thin Solid Films, 550, 239, 2014 |
| 2 |
Deposition of electronic quality amorphous silicon, a-Si : H, thin films by a hollow cathode plasma-jet reactive sputtering system Pribil G, Hubicka Z, Soukup RJ, Ianno NJ Journal of Vacuum Science & Technology A, 19(4), 1571, 2001 |