검색결과 : 11건
| No. | Article |
|---|---|
| 1 |
In-situ Mueller matrix ellipsometry of silicon nanowires grown by plasma-enhanced vapor-liquid-solid method for radial junction solar cells Mrazkova Z, Foldyna M, Misra S, Al-Ghzaiwat M, Postava K, Pistora J, Cabarrocas PRI Applied Surface Science, 421, 667, 2017 |
| 2 |
In-situ spectroscopic ellipsometry of microcrystalline silicon deposited by plasma-enhanced chemical vapor deposition on flexible Fe-Ni alloy substrate for photovoltaic applications Mrazkova Z, Torres-Rios A, Ruggeri R, Foldyna M, Postava K, Pistora J, i Cabarrocas PR Thin Solid Films, 571, 749, 2014 |
| 3 |
Selective sensitivity of ellipsometry to magnetic nanostructures Postava K, Hrabovsky D, Hamrlova J, Pistora J, Wawro A, Baczewski LT, Sveklo I, Maziewski A Thin Solid Films, 519(9), 2627, 2011 |
| 4 |
Depth-sensitive characterization of surface magnetic properties of as-quenched FeNbB ribbons Zivotsky O, Postava K, Hrabovska K, Hendrych A, Pistora J, Kraus L Applied Surface Science, 255(5), 3322, 2008 |
| 5 |
Influence of V and Mo overlayer on magneto-optical Kerr effect in ultrathin Co films Postava K, Kurant Z, Maziewski A, Stupakiewic A, Baczewski LT, Wawro A, Aoyama M, Yamaguchi T Applied Surface Science, 254(1), 360, 2007 |
| 6 |
Optical measurements of silicon wafer temperature Postava K, Aoyama M, Mistrik J, Yamaguchi T, Shio K Applied Surface Science, 254(1), 416, 2007 |
| 7 |
Spectroscopic ellipsometry of carbon nanotube formation in SiC surface decomposition Matsumoto K, Maeda H, Kawaguchi Y, Takahashi K, Aoyama M, Yamaguchi T, Postava K Thin Solid Films, 455-56, 339, 2004 |
| 8 |
Magneto-optical ellipsometry of systems containing thick layers Postava K, Zivotsky O, Pistora J, Yamaguchi I Thin Solid Films, 455-56, 615, 2004 |
| 9 |
Optical characterization of TiN/SiO2(1000 nm)/Si system by spectroscopic ellipsometry and reflectometry Postava K, Aoyama M, Yamaguchi T Applied Surface Science, 175, 270, 2001 |
| 10 |
Spectroellipsometric characterization of materials for multilayer coatings Postava K, Aoyama M, Yamaguchi T, Oda H Applied Surface Science, 175, 276, 2001 |