화학공학소재연구정보센터
검색결과 : 10건
No. Article
1 Modelling of high temperature optical constants and surface roughness evolution during MOVPE growth of GaN using in-situ spectral reflectometry
Balmer RS, Pickering C, Pidduck AJ, Martin T
Journal of Crystal Growth, 245(3-4), 198, 2002
2 Effect of residual damage on carrier transport properties in a 4H-SiC double implanted bipolar junction transistor
Ortolland S, Wright NG, Johnson CM, Knights AP, Coleman PG, Burrows CP, Pidduck AJ
Materials Science Forum, 353-356, 567, 2001
3 Effect of plasma etching and sacrificial oxidation on 4H-SiC Schottky barrier diodes
Morrison DJ, Pidduck AJ, Moore V, Wilding PJ, Hilton KP, Uren MJ, Johnson CM
Materials Science Forum, 338-3, 1199, 2000
4 Si/SiGe n-type inverted modulation doping using ion implantation
Ahmed A, Dunford RB, Paul DJ, Pepper M, Churchill AC, Robbins DJ, Pidduck AJ
Thin Solid Films, 369(1-2), 324, 2000
5 Two-dimensional electron gas mobility as a function of virtual substrate quality in strained Si/SiGe heterojunctions
Churchill AC, Robbins DJ, Wallis DJ, Griffin N, Paul DJ, Pidduck AJ, Leong WY, Williams GM
Journal of Vacuum Science & Technology B, 16(3), 1634, 1998
6 Electrical properties and uniformity of two dimensional electron gases grown on cleaned SiGe virtual substrates
Paul DJ, Ahmed A, Pepper M, Churchill AC, Robbins DJ, Wallis DJ, Pidduck AJ
Journal of Vacuum Science & Technology B, 16(3), 1644, 1998
7 Optical properties of bonded silicon silicide on insulator ((SOI)-O-2) : a new substrate for electronic and optical devices
Nayar V, Russell J, Carline RT, Pidduck AJ, Quinn C, Nevin A, Blackstone S
Thin Solid Films, 313-314, 276, 1998
8 Atomic-Force Microscopy Studies of Rubbed Polyimide Surfaces Used for Liquid-Crystal Alignment
Pidduck AJ, Bryanbrown GP, Haslam S, Bannister R, Kitely I, Mcmaster TJ, Boogaard L
Journal of Vacuum Science & Technology A, 14(3), 1723, 1996
9 Growth Ripples upon Strained SiGe Epitaxial Layers on Si and Misfit Dislocation Interactions
Cullis AG, Robbins DJ, Barnett SJ, Pidduck AJ
Journal of Vacuum Science & Technology A, 12(4), 1924, 1994
10 AFM and X-Ray Studies of Films Formed by Thermal Evaporation and by the lb Technique
Aliadib Z, Hodge P, Tredgold RH, Woolley M, Pidduck AJ
Thin Solid Films, 242(1-2), 157, 1994