검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
The role of carrier lifetime in forward bias degradation of 4H-SiC PiN diodes Hefner A, McNutt T, Berning D, Singh R, Akuffo A Materials Science Forum, 457-460, 1053, 2004 |
| No. | Article |
|---|---|
| 1 |
The role of carrier lifetime in forward bias degradation of 4H-SiC PiN diodes Hefner A, McNutt T, Berning D, Singh R, Akuffo A Materials Science Forum, 457-460, 1053, 2004 |