검색결과 : 2건
No. | Article |
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1 |
Photo-electron emission and atomic force microscopies of the hydrogen etched 6H-SiC(0001) surface and the initial growth of GaN and AlN Hartman JD, Naniwae K, Petrich C, Nemanich R, Davis RF Applied Surface Science, 242(3-4), 428, 2005 |
2 |
Photo-emission electron microscopy (PEEM) of cleaned and etched 6H-SiC(0001) Hartman JD, Naniwae K, Petrich C, Ramachandran V, Feenstra RM, Nemanich RJ, Davis RF Materials Science Forum, 338-3, 353, 2000 |