검색결과 : 8건
No. | Article |
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1 |
Analysis of degradation mechanisms in AlInN/GaN HEMTs by electroluminescence technique Berthet F, Petitdidier S, Guhel Y, Trolet JL, Mary P, Vivier A, Gaquiere C, Boudart B Solid-State Electronics, 127, 13, 2017 |
2 |
Bias voltage dependent electrochemical impedance spectroscopy of p- and n-type silicon substrates Chemla M, Dufreche JF, Darolles I, Rouelle F, Devilliers D, Petitdidier S, Levy D Electrochimica Acta, 51(4), 665, 2005 |
3 |
Non uniformities of silicon oxide films grown in peroxide mixtures Bertagna V, Petitdidier S, Rochat N, Rouchon D, Besson P, Erre R, Chemla M Journal of Electroanalytical Chemistry, 584(1), 54, 2005 |
4 |
Growth mechanism and characterization of chemical oxide films produced in peroxide mixtures on Si(100) surfaces Petitdidier S, Bertagna V, Rochat N, Rouchon D, Besson P, Erre R, Chemla M Thin Solid Films, 476(1), 51, 2005 |
5 |
Thickness of surface thin oxide layers determined by impedance spectroscopy using silicon/oxide/electrolyte (SOE) structures Chemla M, Bertagna V, Erre R, Rouelle F, Petitdidier S, Levy D Applied Surface Science, 227(1-4), 193, 2004 |
6 |
Silicon surface wet cleaning and chemical oxide growth by a novel treatment in aqueous chlorine solutions Chemla M, Durand-Vidal S, Zanna S, Petitdidier S, Levy D Electrochimica Acta, 49(21), 3545, 2004 |
7 |
R and C impedance components equivalent to the charge distribution within Si-substrate depletion layer Chemla M, Bertagna V, Erre R, Rouelle F, Petitdidier S, Levy D Electrochemical and Solid State Letters, 6(1), G7, 2003 |
8 |
Electrochemical study for the characterisation of wet silicon oxide surfaces Bertagna V, Erre R, Rouelle F, Chemla M, Petitdidier S, Levy D Electrochimica Acta, 47(1-2), 129, 2001 |