화학공학소재연구정보센터
검색결과 : 8건
No. Article
1 Analysis of degradation mechanisms in AlInN/GaN HEMTs by electroluminescence technique
Berthet F, Petitdidier S, Guhel Y, Trolet JL, Mary P, Vivier A, Gaquiere C, Boudart B
Solid-State Electronics, 127, 13, 2017
2 Bias voltage dependent electrochemical impedance spectroscopy of p- and n-type silicon substrates
Chemla M, Dufreche JF, Darolles I, Rouelle F, Devilliers D, Petitdidier S, Levy D
Electrochimica Acta, 51(4), 665, 2005
3 Non uniformities of silicon oxide films grown in peroxide mixtures
Bertagna V, Petitdidier S, Rochat N, Rouchon D, Besson P, Erre R, Chemla M
Journal of Electroanalytical Chemistry, 584(1), 54, 2005
4 Growth mechanism and characterization of chemical oxide films produced in peroxide mixtures on Si(100) surfaces
Petitdidier S, Bertagna V, Rochat N, Rouchon D, Besson P, Erre R, Chemla M
Thin Solid Films, 476(1), 51, 2005
5 Thickness of surface thin oxide layers determined by impedance spectroscopy using silicon/oxide/electrolyte (SOE) structures
Chemla M, Bertagna V, Erre R, Rouelle F, Petitdidier S, Levy D
Applied Surface Science, 227(1-4), 193, 2004
6 Silicon surface wet cleaning and chemical oxide growth by a novel treatment in aqueous chlorine solutions
Chemla M, Durand-Vidal S, Zanna S, Petitdidier S, Levy D
Electrochimica Acta, 49(21), 3545, 2004
7 R and C impedance components equivalent to the charge distribution within Si-substrate depletion layer
Chemla M, Bertagna V, Erre R, Rouelle F, Petitdidier S, Levy D
Electrochemical and Solid State Letters, 6(1), G7, 2003
8 Electrochemical study for the characterisation of wet silicon oxide surfaces
Bertagna V, Erre R, Rouelle F, Chemla M, Petitdidier S, Levy D
Electrochimica Acta, 47(1-2), 129, 2001