검색결과 : 8건
| No. | Article |
|---|---|
| 1 |
Characterization of the morphology of titanium and titanium (IV) oxide nanolayers deposited on different substrates by application of grazing incidence X-ray diffraction and X-ray reflectometry techniques Stabrawa I, Kubala-Kukus A, Banas D, Pepponi G, Braziewicz J, Pajek M, Teodorczyk M Thin Solid Films, 671, 103, 2019 |
| 2 |
Shungite Carbon as Unexpected Natural Source of Few-Layer Graphene Platelets in a Low Oxidation State Tamburri E, Carcione R, Politi S, Angjellari M, Lazzarini L, Vanzetti LE, Macis S, Pepponi G, Terranova ML Inorganic Chemistry, 57(14), 8487, 2018 |
| 3 |
Angle resolved XPS for selective characterization of internal and external surface of porous silicon Lion A, Laidani N, Bettotti P, Piotto C, Pepponi G, Barozzi M, Scarpa M Applied Surface Science, 406, 144, 2017 |
| 4 |
Low temperature deposition of bifacial CIGS solar cells on Al-doped Zinc Oxide back contacts Cavallari N, Pattini F, Rampino S, Annoni F, Barozzi M, Bronzoni M, Gilioli E, Gombia E, Maragliano C, Mazzer M, Pepponi G, Spaggiari G, Fornari R Applied Surface Science, 412, 52, 2017 |
| 5 |
Evolution of arsenic in high fluence plasma immersion ion implanted silicon: Behavior of the as-implanted Surface Vishwanath V, Demenev E, Giubertoni D, Vanzetti L, Koh AL, Steinhauser G, Pepponi G, Bersani M, Meirer F, Foad MA Applied Surface Science, 355, 792, 2015 |
| 6 |
Deactivation of submelt laser annealed arsenic ultrashallow junctions in silicon during subsequent thermal treatment Giubertoni D, Pepponi G, Sahiner MA, Kelty SP, Gennaro S, Bersani M, Kah M, Kirkby KJ, Doherty R, Foad MA, Meirer F, Streli C, Woicik JC, Pianetta P Journal of Vacuum Science & Technology B, 28(1), C1B1, 2010 |
| 7 |
Grazing incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for the characterization of ultrashallow arsenic distribution in silicon Pepponi G, Giubertoni D, Bersani M, Meirer F, Ingerle D, Steinhauser G, Streli C, Hoenicke P, Beckhoff B Journal of Vacuum Science & Technology B, 28(1), C1C59, 2010 |
| 8 |
Ultralow energy boron implants in silicon characterization by nonoxidizing secondary ion mass spectrometry analysis and soft x-ray grazing incidence x-ray fluorescence techniques Giubertoni D, Iacob E, Hoenicke P, Beckhoff B, Pepponi G, Gennaro S, Bersani M Journal of Vacuum Science & Technology B, 28(1), C1C84, 2010 |