검색결과 : 1건
No. | Article |
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1 |
Use of variogram analysis to classify field peas with and without internal defects caused by weevil infestation Nansen C, Zhang XC, Aryamanesh N, Yan GJ Journal of Food Engineering, 123, 17, 2014 |
No. | Article |
---|---|
1 |
Use of variogram analysis to classify field peas with and without internal defects caused by weevil infestation Nansen C, Zhang XC, Aryamanesh N, Yan GJ Journal of Food Engineering, 123, 17, 2014 |