검색결과 : 10건
| No. | Article |
|---|---|
| 1 |
Height and diameter dependence of carbon nanotube forests on the porosity and thickness of catalytic layers Papa Z, Kecsenovity E, Fejes D, Budai J, Toth Z, Hernadi K Applied Surface Science, 428, 885, 2018 |
| 2 |
Ultrafast in-situ null-ellipsometry for studying pulsed laser - Silicon surface interactions Csontos J, Toth Z, Papa Z, Gabor B, Fule M, Gilicze B, Budai J Applied Surface Science, 421, 325, 2017 |
| 3 |
Ellipsometric study of peptide layers - island-like character, depolarization and quasi-absorptione Papa Z, Ramakrishnan S, Martin M, Cloitre T, Zimanyi L, Toth Z, Gergely C, Budai J Applied Surface Science, 421, 707, 2017 |
| 4 |
Spectroscopic ellipsometric investigation of graphene and thin carbon films from the point of view of depolarization effects Papa Z, Csontos J, Smausz T, Toth Z, Budai J Applied Surface Science, 421, 714, 2017 |
| 5 |
Interactions at the Peptide/Silicon Surfaces: Evidence of Peptide Multilayer Assembly Papa Z, Ramakrishnan SK, Martin M, Coitre T, Zimanyi L, Marquez J, Budai J, Toth Z, Gergely C Langmuir, 32(28), 7250, 2016 |
| 6 |
Spectroscopic ellipsometric and Raman spectroscopic investigations of pulsed laser treated glassy carbon surfaces Csontos J, Papa Z, Gardian A, Fule M, Budai J, Toth Z Applied Surface Science, 336, 343, 2015 |
| 7 |
Depolarization correction method for ellipsometric measurements of large grain size zinc-oxide films Papa Z, Budai J, Hanyecz I, Csontos J, Toth Z Thin Solid Films, 571, 562, 2014 |
| 8 |
Ellipsometric analysis of silicon surfaces textured by ns and sub-ps KrF laser pulses Toth Z, Hanyecz I, Gardian A, Budai J, Csontos J, Papa Z, Fule M Thin Solid Films, 571, 631, 2014 |
| 9 |
Refractive index depth profile and its relaxation in polydimethylsiloxane (PDMS) due to proton irradiation Szilasi SZ, Budai J, Papa Z, Huszank R, Toth Z, Rajta I Materials Chemistry and Physics, 131(1-2), 370, 2011 |
| 10 |
Investigation of surface roughness on etched glass surfaces Papa Z, Budai J, Farkas B, Toth Z Thin Solid Films, 519(9), 2903, 2011 |