검색결과 : 2건
No. | Article |
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1 |
Real time spectroscopic ellipsometric analysis of Ge film growth on Si(001) substrates Palange E, Di Gaspare L, Evangelisti E Thin Solid Films, 428(1-2), 160, 2003 |
2 |
Metal-Ge-Si heterostructures for near-infrared light detection Colace L, Masini G, Galluzzi F, Assanto G, Capellini G, Di Gaspare L, Palange E, Evangelisti F Journal of Vacuum Science & Technology B, 17(2), 465, 1999 |