화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 Monoatomic and cluster beam effect on ToF-SIMS spectra of self-assembled monolayers on gold
Tuccitto N, Torrisi V, Delfanti I, Licciardello A
Applied Surface Science, 255(4), 874, 2008
2 Sources of error in quantitative depth profiling of shallow doping distributions by secondary-ion-mass spectrometry in combination with oxygen flooding
Wittmaack K, Corcoran SF
Journal of Vacuum Science & Technology B, 16(1), 272, 1998
3 On the Spatial-Resolution of 2-Dimensional Doping Profiles as Measured Using Secondary-Ion Mass-Spectrometry Tomography
Liu X, Goodwinjohansson S, Jacobson JD, Ray MA, Mcguire GE
Journal of Vacuum Science & Technology B, 12(1), 116, 1994