검색결과 : 3건
No. | Article |
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1 |
RF SOI CMOS technology on 1st and 2nd generation trap-rich high resistivity SOI wafers Esfeh BK, Makovejev S, Basso D, Desbonnets E, Kilchytska V, Flandre D, Raskin JP Solid-State Electronics, 128, 121, 2017 |
2 |
Impact of strain on gate-induced floating body effect for partially depleted silicon-on-insulator p-type metal-oxide-semiconductor-field-effect-transistors Lo WH, Chang TC, Dai CH, Chung WL, Chen CE, Ho SH, Tsai JY, Chen HM, Liu GR, Cheng O, Huang CT Thin Solid Films, 528, 10, 2013 |
3 |
Comparative study of low frequency noise and hot-carrier reliability in SiGePD SOI pMOSFETs Choi SS, Choi AR, Yang JW, Hwang YW, Cho DH, Shim KH Applied Surface Science, 254(19), 6190, 2008 |