검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Functionalization of 2D macroporous silicon under the high-pressure oxidation Karachevtseva L, Kartel M, Kladko V, Gudymenko O, Bo W, Bratus V, Lytvynenko O, Onyshchenko V, Stronska O Applied Surface Science, 434, 142, 2018 |
| 2 |
Interface defects in n-type 3C-SiC/SiO2: An EPR study of oxidized porous silicon carbide single crystals von Bardeleben HJ, Cantin JL, Ke L, Shishkin Y, Devaty RP, Choyke WJ Materials Science Forum, 483, 273, 2005 |
| 3 |
Modification of the oxide/semiconductor interface by high temperature NO treatments: A combined EPR, NRA and XPS study on oxidized porous and bulk n-type 4H-SiC von Bardeleben HJ, Cantin JL, Vickridge IC, Song YW, Dhar S, Feldman LC, Williams JR, Ke L, Shishkin Y, Devaty RP, Choyke WJ Materials Science Forum, 483, 277, 2005 |
| 4 |
Electrically detected magnetic resonance of near-interface defects in Si pn-junction structures with LOCOS isolation Wimbauer T, Mochizuki Y, Ito K, Horikawa M, Kitano T Applied Surface Science, 159, 72, 2000 |