화학공학소재연구정보센터
검색결과 : 15건
No. Article
1 Growth of high Mg content wurtzite MgZnO epitaxial films via pulsed metal organic chemical vapor deposition
Alema F, Ledyaev O, Miller R, Beletsky V, Osinsky A, Schoenfeld WV
Journal of Crystal Growth, 435, 6, 2016
2 Effect of bias voltage polarity on hydrogen sensing with AlGaN/GaN Schottky diodes
Anderson TJ, Wang HT, Kang BS, Ren F, Pearton SJ, Osinsky A, Dabiran A, Chow PP
Applied Surface Science, 255(5), 2524, 2008
3 Selective detection of Hg (II) ions from Cu(II) and Pb(II) using AlGaN/GaN high electron mobility transistors
Wang HT, Kang BS, Chancellor TF, Lele TP, Tseng Y, Ren F, Pearton SJ, Dabiran A, Osinsky A, Chow PP
Electrochemical and Solid State Letters, 10(11), J150, 2007
4 Thermal stability of Ti/Al/Pt/Au and Ti/Au ohmic contacts on n-type ZnCdO
Chen JJ, Jang S, Ren F, Rawal S, Li YJ, Kim HS, Norton DP, Pearton SJ, Osinsky A
Applied Surface Science, 253(2), 746, 2006
5 Optical characterization of ZnMnO-based dilute magnetic semiconductor structures
Buyanova IA, Chen WM, Ivill MP, Pate R, Norton DP, Pearton SJ, Dong JW, Osinsky A, Hertog B, Dabiran AM, Chow PP
Journal of Vacuum Science & Technology B, 24(1), 259, 2006
6 Diffusion-controlled selective wet etching of ZnCdO over ZnO
Chen JJ, Ren F, Norton DP, Pearton SJ, Osinsky A, Dong JW, Chu SNG
Electrochemical and Solid State Letters, 8(12), G359, 2005
7 Design and simulation of ZnO-based light-emitting diode structures
Han SY, Yang H, Norton DR, Pearton SJ, Ren F, Osinsky A, Dong JW, Hertog B, Chow PP
Journal of Vacuum Science & Technology B, 23(6), 2504, 2005
8 Electron trapping effects in C- and Fe-doped GaN and AlGaN
Lopatiuk O, Osinsky A, Dabiran A, Gartsman K, Feldman I, Chernyak L
Solid-State Electronics, 49(10), 1662, 2005
9 Comparison of Ir and Ni-based Ohmic contacts for AlGaN/GaN high electron mobility transistors
Fitch RC, Gillespie JK, Moser N, Jessen G, Jenkins T, Dettmer R, Via D, Crespo A, Dabiran AM, Chow PP, Osinsky A, La Roche JR, Ren F, Pearton SJ
Journal of Vacuum Science & Technology B, 22(2), 619, 2004
10 Annealing temperature stability of Ir and Ni-based Ohmic contacts on AlGaN/GaN high electron mobility transistors
Kang BS, Kim S, La Roche JR, Ren F, Fitch RC, Gillespie JK, Moser N, Jenkins T, Sewell J, Via D, Crespo A, Dabiran AM, Chow PP, Osinsky A, Pearton SJ
Journal of Vacuum Science & Technology B, 22(6), 2635, 2004