검색결과 : 148건
No. | Article |
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1 |
Further optimization of ITO films at the melting point of Sn and configuration of Ohmic contact at the c-Si/ITO interface Das D, Karmakar L Applied Surface Science, 481, 16, 2019 |
2 |
Interface analysis of TiN/n-GaN Ohmic contacts with high thermal stability Zhu YF, Huang R, Li ZC, Hao H, An YX, Liu T, Zhao YF, Shen Y, Guo Y, Li FS, Ding SN Applied Surface Science, 481, 1148, 2019 |
3 |
Formation of Ohmic contacts on laser irradiated n-type 6H-SiC without thermal annealing Wu Y, Ji LF, Lin ZY, Hong MH, Wang SC, Zhang YZ Current Applied Physics, 19(4), 521, 2019 |
4 |
Ag nanoparticles enhanced vertically-aligned CuO nanowire arrays grown on Cu foam for stable hybrid supercapacitors with high energy density Zhang XT, Zhang CF, Abas A, Zhang Y, Mu XM, Zhou JY, Su Q, Lan W, Xie EQ Electrochimica Acta, 296, 535, 2019 |
5 |
Ohmic contact to AlGaN/GaN HEMT with electrodes in contact with heterostructure interface Chen DB, Wan LJ, Li J, Liu ZK, Li GQ Solid-State Electronics, 151, 60, 2019 |
6 |
High-temperature reliability of Ni/Nb ohmic contacts on 4H-SiC for harsh environment applications Cuong VV, Ishikawa S, Maeda T, Sezaki H, Yasuno S, Koganezawa T, Miyazaki T, Kuroki SI Thin Solid Films, 669, 306, 2019 |
7 |
Effects of rapid thermal annealing on the contact of tungsten/p-diamond Zhao D, Li FN, Liu ZC, Chen XD, Wang YF, Shao GQ, Zhu TF, Zhang MH, Zhang JW, Wang JJ, Wang W, Wang HX Applied Surface Science, 443, 361, 2018 |
8 |
Study on the measurement accuracy of circular transmission line model for low-resistance Ohmic contacts on III-V wide band-gap semiconductors Liu T, Huang R, Li FS, Huang ZL, Zhang J, Liu JP, Zhang LQ, Zhang SM, An DS, Yang H Current Applied Physics, 18(7), 853, 2018 |
9 |
Study on the measurement accuracy of circular transmission line model for low-resistance Ohmic contacts on III-V wide band-gap semiconductors Liu T, Huang R, Li FS, Huang ZL, Zhang J, Liu JP, Zhang LQ, Zhang SM, An DS, Yang H Current Applied Physics, 18(7), 853, 2018 |
10 |
Study on the measurement accuracy of circular transmission line model for low-resistance Ohmic contacts on III-V wide band-gap semiconductors Liu T, Huang R, Li FS, Huang ZL, Zhang J, Liu JP, Zhang LQ, Zhang SM, An DS, Yang H Current Applied Physics, 18(7), 853, 2018 |