검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
High-reliability ONO gate dielectric for power MOSFETs Tanimoto S, Tanaka H, Hayashi T, Shimoida Y, Hoshi M, Mihara T Materials Science Forum, 483, 677, 2005 |
| 2 |
SiC devices with ONO stacked dielectrics Lipkin LA, Palmour JW Materials Science Forum, 338-3, 1093, 2000 |
| 3 |
Highly durable SiC nMISFET's at 450 degrees C Zhu WJ, Wang XW, Ma TP, Tucker JB, Rao MV Materials Science Forum, 338-3, 1311, 2000 |