검색결과 : 1건
No. | Article |
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1 |
Second Harmonic Generation characterization of SOI wafers: Impact of layer thickness and interface electric field Damianos D, Vitrant G, Lei M, Changala J, Kaminski-Cachopo A, Blanc-Pelissier D, Cristoloveanu S, Ionica I Solid-State Electronics, 143, 90, 2018 |